Temperature control of electronic devices using power following feedback
AssigneeDelta Design, Inc.
InventorsThomas P. Jones, Jonathan E. Turner, Mark F. Malinoski
Life of this patent
Estimating the term…
Abstract
A system and method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger includes measuring an instantaneous power consumption of the device during testing. The heat exchanger is controlled with the thermal controller using the measured instantaneous power consumption by the device to regulate the temperature of the device during testing, wherein the heat exchanger is in conductive contact with the device.
Claims30
A method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger, the method comprising:
- measuring an instantaneous power consumption of the device during testing;
- and
- controlling the heat exchanger with the thermal controller using the measured instantaneous power consumption by the device to regulate the temperature of the device during testing, wherein the heat exchanger is in conductive contact with the device.
A method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger, the method comprising:
- receiving in real-time data corresponding to the power being supplied by the programmable power supply to the device under test;
- and
- controlling the beat exchanger with the thermal controller using the received real-time data to regulate the temperature of the device during testing, wherein the heat exchanger is in conductive contact with the device.
A system for controlling a temperature of a device under test, comprising:
- a measuring device for measuring an instantaneous power consumption by the device during testing;
- a heat exchanger in conductive contact with the device;
- and
- a thermal controller for controlling the heat exchanger by using the measured instantaneous power consumption by the device to regulate the temperature of the device during testing.
In a system in which an electronic device is supplied with a power supply signal and test stimuli signals, and the temperature of the electronic device is actively controlled by a temperature control apparatus, a method for maintaining the temperature of the device near a predetermined set-point temperature, comprising:
- determining changes in power dissipated by the electronic device while the device is being tested;
- adding or removing heat from the device while the device is being tested in response to the changes in power dissipated by the electronic device to maintain the temperature of the device near the predetermined set-point temperature.
A system in which an electronic device is supplied with a power supply signal and test stimuli signals, and the temperature of the device is maintained near a predetermined set-point temperature during testing, comprising:
- a measuring device which determines changes in power dissipated by the electronic device while the device is being tested;
- a temperature control apparatus which adds or removes heat from the device while the device is being tested in response to the changes in power dissipated by the electronic device determined by the measuring device to maintain the temperature of the device near the predetermined set-point temperature.
Dependencies are inferred from the claim text.