Motherboard memory slot ribbon cable and apparatus
AssigneeMicron Technology, Inc.
InventorsSteven J. Brunelle, Saeed Momenpour
Life of this patent
Estimating the term…
Abstract
A testing apparatus system and method for testing computer memory modules. The apparatus includes a motherboard having a processor and at least one resident memory socket fixed to the motherboard. A remote memory socket is provided and located a distance from the resident memory socket, such as on a periphery of the motherboard. The remote memory socket is coupled to the resident memory socket by a conductor assembly such as a ribbon cable and an adapter. A memory module is placed in the remote memory socket and tested using a signal or combination of signals from the processor. A plurality of motherboards, each being configured with remote memory sockets, may be combined to form a testing system suitable for use with an automated handler.
Claims9
A memory device testing apparatus comprising:
- a motherboard including a processor location electrically coupled to at least one resident memory socket, the at least one resident memory socket being fixed to a surface of the motherboard and configured to receive and operatively couple to a memory device;
- at least one adapter operatively coupled to the at least one resident memory socket in lieu of a memory device;
- at least one remote memory socket located adjacent a peripheral edge of the motherboard wherein the at least one remote memory socket is configured substantially similar to the at least one resident memory socket to removably receive a memory device and operatively couple thereto, the at least one remote memory socket being substantially fixed in location relative to the motherboard;
- and
- an electrically conductive pathway extending between the at least one remote memory socket and the at least one adapter.
Dependencies are inferred from the claim text.