Test probe assembly for circuits, circuit element arrays, and associated methods

A test probe device comprising a generally planar arm member assembly comprising:

• a first, a second, a third, a fourth, a fifth, and a sixth elongated, generally planar, electrically conductive arm member, each arm member having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis in a first plane;
• a front portion having an elongated slot extending through the arm member between the side surfaces and comprising a downwardly extending tip terminating in a probe end for contacting a circuit to be tested, the tip of the first and the third arm member shorter than the tip of the second and the fourth arm member, the tip of the second and the fourth arm member shorter than the tip of the fifth and the sixth arm member;
• a rear portion movably positionable within a slot in a retaining block;
• and
• a central portion positioned between the front portion and the rear portion comprising means for connecting to a test circuit;
• wherein the first, the second, and the fifth arm members are relatively positioned in commonly oriented fashion with the second arm member above and generally coplanar with the first arm member in the first plane, the fifth arm member above and generally coplanar with the first arm member in the first plane, the third, the fourth, and the sixth arm members are relatively positioned in commonly oriented fashion with the fourth arm member above and generally coplanar with the third arm member in the first plane, the sixth arm member above and generally coplanar with the third arm member in the first plane, the third, the fourth, and the sixth arm members positioned oppositely oriented to the first, the second, and the fifth arm members, the Up of the fifth arm member adjacent the tip of the sixth arm member, the probe ends of the arm members generally coplanar in a second plane generally perpendicular to the first plane.

A method of testing a microcircuit comprising the steps of:

• providing a test probe comprising a first and a second elongated, generally planar, electrically conductive arm member, each of the first and the second arm member having:
• a pair of generally planar and parallel side surfaces extending along a longitudinal axis in a first plane;
• a front portion having an elongated slot extending through the arm member between the side surfaces and comprising a downwardly extending tip at a front end terminating in a probe end for contacting a circuit to be tested, the tip of the first arm member shorter than the tip of the second arm member;
• a rear portion movably affixable to a retaining block;
• and
• a central portion positioned between the front portion and the rear portion comprising means for connecting to a test circuit;
• wherein the first and the second arm members are relatively positioned in commonly oriented fashion with the second arm member above and generally coplanar with the first arm member in the first plane, the probe ends of the first and the second arm members generally coplamar in a second plane generally perpendicular to the first plane,
• connecting the connecting means of the test probe to a test circuit;
• contacting the test probe ends to a first and a second portion of a circuit to be tested;
• and
• performing a measurement based on signals transmitted from the tips to the test circuit.