Indexing multiple test probe system and method
OwnerDavid Chenginventor
Life of this patent
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Abstract
A multiple test probe system is disclosed. The multiple test probe system includes a support and a mount pivotally coupled to the support. The mount is capable of pivoting to a number of testing positions. A number of probe assemblies are coupled to the mount and associated with a corresponding number of testing positions. The probe assemblies include a number of electrical contacts coupled to a number of wires in a probe bus regardless of a testing position of the mount. The multiple test probe system further includes an indexing device coupled to the mount to cause the mount to move between the testing positions, whereby the indexing device is a Geneva Mechanism.
Claims16
A multiple test probe system comprising:
- a support;
- a probe bus comprising a plurality of wires;
- a mount rotationally coupled to said support and capable of rotating to a plurality of testing positions;
- a plurality of probe assemblies coupled to said mount and associated with said plurality of testing positions, wherein each of said probe assemblies include a plurality of electrical contacts coupled to said plurality of wires of said probe bus regardless of a testing position of said mount;
- a Geneva Mechanism having a driven wheel provided with a plurality of slots, attached to said mount for co-rotation therewith, and a drive wheel rotationally coupled to said support and provided with a drive member engaging one of said plurality of slots of said driven wheel, wherein rotation of said drive wheel relative to said support can provide an incremental angular rotation to said driven wheel due to the engagement of said member with a slot, such that a position after a position when said member is disengaged from said slot coincides with at least one of said plurality of test positions;
- and,
- a motor coupled between said drive wheel and said support.
A method for providing a multiple test probe system comprising:
- providing a support;
- providing a probe bus comprising a plurality of wires;
- providing a mount rotationally coupled to said support and capable of rotating to a plurality of testing positions;
- providing a plurality of probe assemblies coupled to said mount and associated with said plurality of testing positions, wherein each of said probe assemblies include a plurality of electrical contacts coupled to said plurality of wires of said probe bus regardless of a testing position of said mount;
- providing a Geneva Mechanism having a driven wheel provided with a plurality of slots, attached to said mount for co-rotation therewith, and a drive wheel rotationally coupled to said support and provided with a member engaging one of said plurality of slots of said driven wheel, wherein rotation of said drive wheel relative to said support can provide an incremental angular rotation to said driven wheel due to the engagement of said member with a slot, such that a position after a position when said member is disengaged from said slot coincides with at least one of said plurality of test positions;
- and,
- providing a motor coupled between said drive wheel and said support.
Dependencies are inferred from the claim text.