Temperature measurement of an electronic device

A method of measuring the temperature of an electronic device utilising a spectrometer having a slit through which scattered laser light is collected, the method including;

• minimising the width of the spectrometer slit;
• irradiating an arbitrary location on an electronic device using a laser with the device being inactive, determining the phonon frequency of the device at the arbitrary location using the spectrometer and storing the determined phonon frequency;
• irradiating a target location on the electronic device, the target location being proximate to a metal contact, using the laser with the device being active, such that a portion of the laser light directed at the target location is incident on and scattered by the metal contact, and determining the further phonon frequency of the device at the target location with the spectrometer;
• determining the difference between the stored phonon frequency and further phonon frequency;
• and
• determining the temperature of the active device at the target location as a function of the determined phonon frequency difference.

A method of measuring the temperature of an electronic device, the method comprising;

• irradiating a target location on the electronic device using a laser with the device being inactive and determining a first phonon frequency of the device at the target location;
• irradiating the target location using the laser with the electronic device being active and determining a second phonon frequency at the target location;
• determining the difference between the first and second phonon frequency;
• and
• determining the temperature of the active electronic device at the target location as a function of the determined phonon frequency difference;
• wherein the target location is selected by detecting areas on the electronic device of comparatively high temperature by measuring infra-red radiation emitted by the device.

A method of measuring the temperature of an electronic device utilising a spectrometer having a slit through which scattered laser light is collected, the method including;

• minimising the width of the spectrometer slit;
• irradiating an arbitrary location on an electronic device using a laser with the device being inactive, determining the phonon frequency of the device at the arbitrary location using the spectrometer and storing the determined phonon frequency;
• irradiating a target location on the electronic device using the laser with the device being active and determining the further phonon frequency of the device at the target location with the spectrometer;
• determining the difference between the stored phonon frequency and further phonon frequency;
• and
• determining the temperature of the active device at the target location as a function of the determined phonon frequency difference;
• wherein the target location is selected by detecting areas on the electronic device of comparatively high temperature by measuring infra-red radiation emitted by the device.