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AssigneeRenesas Technology Corp.
InventorsShinya Okamoto, Yasuhiko Fukushima
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A memory device redundant repair analysis method, recording medium and apparatus allowing a redundant repair analysis method for a memory device with a plurality of redundant repair analysis rules. It is possible to provide a memory device redundant repair analysis method, recording medium and apparatus that allow a redundant repair analysis method for a memory device with a plurality of redundant repair analysis rules by carrying out processing of finally merging a plurality of repair codes corresponding to respective rules obtained by applying a plurality of redundant repair analysis rules into one code. It is also possible to provide a memory device redundant repair analysis method, recording medium and apparatus that allow a redundant repair analysis method for a memory device with a plurality of redundant repair analysis rules by performing processing of appending a plurality of repair codes corresponding to the respective rules obtained by applying a plurality of redundant repair analysis rules to one code after making each analysis determination.
A memory device redundant repair analysis method for performing a redundant repair analysis on a memory device to analyze the memory device for a defect in order to repair the defect with a redundant memory cell, comprising the steps of:
A memory device redundant repair analysis apparatus for performing a redundant repair analysis on a memory device to analyze the memory device for a defect in order to repair the defect with a redundant memory cell comprising:
Dependencies are inferred from the claim text.