Inexpensive method for diagnosing manufacturing defects in an embedded system
AssigneeIntel Corporation
InventorMing Y. Li
Life of this patent
Estimating the term…
Abstract
A system and method is provided for detecting defects in an embedded architecture or micro-processor based system. A look-up table, located with in a programmable logic device, is accessed to obtain a value for a particular byte of a predetermined data pattern. The predetermined data pattern is associated with data from a bus coupled to the programmable logic device. The accessed value of the predetermined data pattern is compared to data that is received by the programmable logic device from a memory coupled to the programmable logic device via the bus. An alarm mechanism, to indicate an improper data comparison, is triggered based upon the comparison of the predetermined data pattern and the data received from the memory.
Claims21
A system for detecting defects in an embedded architecture, the system comprising:
- a programmable logic device configured to be coupled to a bus and including a look-up table containing a predetermined data pattern associated with data on the bus;
- a memory configured to be coupled to the programmable logic device via the bus, the memory storing a program for use by a microprocessor coupled to the buss and
- a counter configured to be electronically coupled to the memory and electronically coupled to the look-up table, wherein the counter maintains a status of a plurality of bytes to be checked during a diagnostic analysis,
- wherein, the look-up table is configured to be accessed to compare the predetermined data pattern with data received from the memory via the bus.
A system for detecting defects in an embedded architecture, the system comprising:
- a programmable logic device configured to be coupled to a bus and including a look-up table containing a predetermined data pattern associated with data on the bus;
- a memory configured to be coupled to the programmable logic device via the bus, the memory storing a program for use by a microprocessor coupled to the bus;
- a counter configured to receive the input signals from the memory and an instruction cache of the microprocessor and maintain a status of bytes to check during a diagnostic analysis of the embedded architecture
- a retrieving portion configured to retrieve values of the predetermined data pattern from the look-up table;
- a comparator configured to compare the retrieved values from the look-up table with the data received from the memory;
- and
- an alarm mechanism configured to indicate an improper data pattern comparison at the comparator,
- wherein, the look-up table is configured to be accessed to compare the predetermined data pattern with data received from the memory via the bus.
A system for detecting defects in an embedded architecture, the system comprising:
- a programmable logic device configured to be coupled to a bus and including a look-up table containing a predetermined data pattern associated with data on the bus;
- a memory configured to be coupled to the programmable logic device via the bus, the memory storing a program for use by a microprocessor coupled to the bus;
- wherein, the look-up table is configured to be accessed to compare the predetermined data pattern with data received from the memory via the bus, and
- wherein the predetermined data pattern includes data associated with a walking ones test.
A method for detecting defects in an embedded architecture, the method comprising:
- accessing a counter electronically coupled to a look-up table, included in a programmable logic device, and to a memory, wherein the counter maintains a status of a plurality of bytes to be checked during a diagnostic analysis;
- accessing the look-up table included in a programmable logic device, the look-up table containing a predetermined data pattern associated with data on a bus coupled to the programmable logic device;
- and
- receiving data at the programmable logic device from the memory via the bus;
- and
- comparing the predetermined data pattern with the data received from the memory.
A method for detecting defects in an embedded architecture, the method comprising:
- accessing a look-up table included in a programmable logic device, the look-up table containing a predetermined data pattern associated with data on a bus coupled to the programmable logic device;
- receiving data at the programmable logic device from a memory via the and
- comparing the predetermined data pattern with the data received from the memory,
- wherein the predetermined data pattern includes data associated with a walking ones test.
A computer-readable medium encoded with a program for detecting defects in a embedded architecture, the program comprising:
- accessing a counter electronically coupled to a look-up table, included in a programmable logic device, and to a memory, wherein the counter maintains a status of a plurality of bytes to be checked during a diagnostic analysis:
- accessing the look-up table, the look-up table containing a predetermined data pattern associated with data on a bus coupled to the programmable logic device;
- and
- receiving data at the programmable logic device from the memory via the bus;
- and
- comparing the predetermined data pattern with the data received from the memory.
A computer-readable medium encoded with a program for detecting defects in a embedded architecture, the program comprising:
- accessing a look-up table included in a programmable logic device, the look-up table containing a predetermined data pattern associated with data on a bus coupled to the programmable logic device;
- and
- receiving data at the programmable logic device from a memory via the bus;
- and
- comparing the predetermined data pattern with the data received from the memory,
- wherein the predetermined data pattern includes data associated with a walking ones test.
Dependencies are inferred from the claim text.