Contact probe with guide unit and fabrication method thereof

A contact probe comprising:

• a plunger unit adapted to make contact with a circuit to be tested,
• a spring unit supporting said plunger unit at one end of said spring unit,
• a lead wire connection unit electrically connecting another end of said spring unit with a lead wire, and
• a guide unit extending parallel to and adjacently along said spring unit in a final operative configuration of said contact probe such that said guide unit maintains said spring unit at a constant alignment parallel to said guide unit,
• wherein said plunger unit, said spring unit, said lead wire connection unit, and said guide unit are formed integrally as an integral one-piece component, with said plunger unit, said spring unit, said lead wire connection unit and said guide unit all lying flatly on and extending flatly along a single common plane of said integral one-piece component in said final operative configuration.