Electrical conduction array on the bottom side of a tester thermal head
AssigneeAdvanced Micro Devices, Inc.
InventorsDonald L. Lambert, John D. Redden
Life of this patent
Estimating the term…
Abstract
An apparatus for testing an electrical device which includes fuses has a resilient, compressive, insulating base amounted to the underside of a thermal head. A plurality of conductive elements are mounted to the base in parallel relation. A number of these conductive elements are caused to be brought into contact with and bridge a fuse of the device when the thermal head is brought in dose proximity to the device. The conductive elements cause the fuse to be bridged, so that connection is provided between one side of the fuse and the other.
Claims14
Apparatus for bridging a fuse of an electronic device comprising:
- a base;
- and
- a conductive element mounted on the base, which may be brought into contact with and bridge a fuse, so as to provide operable conductive communication between elements connected to a fuse.
Apparatus for testing an electrical device which includes a fuse comprising:
- a thermal head;
- a base mounted on the thermal head;
- and
- a conductive element mounted to the base, which may be brought into contact with and bridge a fuse with the thermal head adjacent an electrical device, so as to provide operable conductive communication between elements connected to a fuse.
Dependencies are inferred from the claim text.