Thermally enhanced semiconductor chip having integrated bonds over active circuits
AssigneeTexas Instruments Incorporated
InventorTaylor R. Efland
Life of this patent
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Abstract
An integrated circuit (IC) chip has a metal network of electrical power distribution lines which have a thermal conductance at least an order of magnitude greater than underlying thin film electrical interconnects. These lines are deposited on the surface of the chip (FIG. 2), located directly over active IC components, and electrically and thermally connected vertically to selected active components below the lines. Electrical conductors are operable to connect the lines to an outside source, and additional electrically non-functional conductors are distributed on the lines, operable to steepen the thermal gradient for thermal flux away from said active components and lines.
Claims4
A method for fabricating a semiconductor device including a semiconductor chip having first and second surfaces, comprising the steps of:
- forming an integrated circuit on said first chip surface, said circuit including active components, at least one metal layer, and a mechanically strong, electrically insulating protective overcoat;
- forming a plurality of vias through said overcoat to access said at least one metal layer;
- forming said vias by depositing a stack of metal films on said overcoat, said stack having at least one stress-absorbing film and an outermost film being non-corrodible and metallurgically attachable;
- patterning said films into a network of lines such that said lines are located substantially vertical over said active components and are suitable for heat dissipation;
- forming a plurality of windows in said overcoat to expose circuit contact pads;
- attaching electrical conductors operable to connect said lines to an outside source;
- attaching additional thermal-only conductors, distributed on said lines, operable to steepen the temperature gradient for thermal flux away from said active components and lines;
- and
- attaching electrical conductors to said circuit contact pads.
Dependencies are inferred from the claim text.