Method of manufacturing an electronic device
AssigneeKabushiki Kaisha Toshiba
InventorsMasatoshi Sakurai, Katsuyuki Naito
Life of this patent
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Abstract
An organic thin film device in which as a junction interface shape between an organic thin film and an adjacent layer, a sectional contour shape of a device interface having a Hausdorff dimension, as one fractal dimension, falling within the range 1.5≦D≦2.0 is formed by defining the Hausdorff dimension and its scale length.
Claims8
A method for manufacturing an electronic device which is used as an organic thin film device comprising a first electrode, a first organic material containing layer formed on said first electrode, a second organic material containing layer formed on said first organic material containing layer, and a second electrode formed on said second organic material containing layer,
- wherein said first and second organic material containing layers are formed by mixing two types of organic materials and separating said organic materials by applying at least one of an electric field, a magnetic field, irradiation of light, a temperature gradient, or a centrifugal force under a supersaturated condition, and an interface between the first and the second organic material containing layers comprises an aggregation of dendritic structures with a cross-section of a portion of the interface having a contour shape which has a Hausdorff dimension D falling within the range 1.5≦D≦2.0 at a scale length of 10 μm.
A method of manufacturing an organic solar cell comprising a first electrode, a first organic material containing layer formed on said first electrode, a second organic material containing layer formed on the first organic material containing layer, and a second electrode formed on said second organic material containing layer,
- wherein said first and second organic material containing layers are formed by mixing two types of organic materials and separating said organic materials by applying at least one of an electric field, a magnetic field, irradiation of light, a temperature gradient, or a centrifugal force, and a contour shape of an interface in a section of said first and second organic material containing layers has a Hausdorff dimension D falling within the range 1.7≦D≦2.0 at a scale length of 100 nm.
Dependencies are inferred from the claim text.