Thermopile infrared sensor and method for inspecting the same
AssigneeDenso Corporation
InventorsKazuaki Hamamoto, Inao Toyoda
Life of this patent
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AssigneeDenso Corporation
InventorsKazuaki Hamamoto, Inao Toyoda
Estimating the term…
A sensor has a series circuit, which includes first and second end terminals, a set of thermocouples electrically connected in series between the first end terminal and the second end terminal, and electrical inspection terminals, which extend from corresponding intermediate points in the series circuit between the first end terminal and the second end terminal to divide the set of thermocouples into smaller groups of thermocouples. A resistance value of each group of thermocouples is measured through adjacent two of the first and second end terminals and the electrical inspection terminals while the sensor is in a wafer state. Whether the thermopile infrared sensor is normal is determined based on the measured resistance value of each group of thermocouples.
A thermopile infrared sensor comprising:
A method for inspecting a thermopile infrared sensor having a series circuit, wherein the series circuit includes first and second end terminals, a set of thermocouples electrically connected in series between the first end terminal and the second end terminal, and at least one electrical inspection terminal, which extends from a corresponding intermediate point in the series circuit between the first end terminal and the second end terminal to divide the set of thermocouples into at least two groups of thermocouples, the method comprising steps of:
A thermopile infrared sensor comprising:
A thermopile infrared sensor comprising:
Dependencies are inferred from the claim text.