Focused electron and ion beam systems
AssigneeThe Regents of the University of California
InventorsKa-Ngo Leung, Jani Reijonen, Arun Persaud, Qing Ji, Ximan Jiang
Life of this patent
Estimating the term…
Loading patent…
AssigneeThe Regents of the University of California
InventorsKa-Ngo Leung, Jani Reijonen, Arun Persaud, Qing Ji, Ximan Jiang
Estimating the term…
An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.
A ion and electron source, comprising:
Apparatus comprising a plurality of sources, each source producing a different ion, one source producing an electron beam, wherein each source comprises:
Dependencies are inferred from the claim text.