Method and apparatus for testing a storage device

A method of testing the I/O functionality of a memory store, comprising:

• selecting a byte pattern index value;
• generating a first set of test data using said byte pattern index value and a user byte value;
• storing a sector address, said byte pattern index value, said user byte value, and said first set of test data in a sector;
• reading said sector address, said byte pattern index value, said user byte value, and said first set of test data from said sector;
• generating a second set of test data using said byte pattern index value and said user byte value;
• and
• comparing said second set of test data with the first set of test data.

An apparatus for writing test data in a memory space within a memory store, comprising:

• a computer having a storage device interface controller;
• a storage device having an interface suitable for coupling to said storage device interface controller and the memory store;
• a first function for generating a header having an address representing the location of the memory space in the memory store, and a seed value;
• a second function for generating a set of values using said seed value;
• and
• a third function for storing said header and said set of values in the memory space.

An apparatus for testing a memory space within a memory store, comprising:

• a computer having a storage device interface controller;
• a storage device having an interface suitable for coupling to said storage device interface controller and the memory store;
• a first function for selecting a byte pattern index value;
• a second function for generating a first set of test data using said byte pattern index value and a user byte value;
• a third function for storing the address of the memory space, said byte pattern index value, said user byte value, and said first set of test data in the memory space;
• a fourth function for reading the address of the memory space, said byte pattern index value, said user byte value, and said first set of test data from the memory space;
• a fifth function for generating a second set of test data using said byte pattern index value and said user byte value;
• and
• a sixth function for comparing said second set of test data with the first set of test data.