Optical probes and methods for spectral analysis
AssigneeTextron Systems Corporation
InventorCharles W. Von Rosenberg
Life of this patent
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Abstract
The present invention relates to spectral analysis systems and methods for determining physical and chemical properties of a sample by measuring the optical characteristics of light emitted from the sample. In one embodiment, a probe head for use with a spectrometer includes a reflector for illuminating a sample volume disposed circumferentially about the light source of the probe head. In another embodiment, a probe head includes an optical blocking element for forcing the optical path between the light source and an optical pick-up optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pick-up to facilitate calibration of the spectrometer.
Claims25
A probe head for use with a spectrometer to analyze a material, the probe head comprising:
- a light source arranged to irradiate a sample volume of the material proximate the probe head;
- an optical pick-up arranged to receive light emitted from the irradiated sample volume and transmit the emitted light to the spectrometer,
- a shaft having a longitudinal axis and housing the light source and the optical pick-up, and
- a reflector positioned within the shaft and having a first reflective surface for reflecting light from the light source through a wall of the shaft and into the sample volume to irradiate the sample volume, and having a second reflective surface for reflecting light emitted from the sample to the optical pick-up.
A probe head for use with a spectrometer to analyze a material, the probe head comprising:
- a shaft extending along a longitudinal axis;
- a light source arranged within the shaft;
- a reflector arranged within the shaft a longitudinal distance from the light source to reflect at least a portion of the light from the light source in a direction generally perpendicular to the longitudinal axis of the shaft to irradiate a sample volume of the material proximate the probe head;
- and
- an optical pick-up arranged within the shaft to receive light emitted from the irradiated sample volume and transmit the received light to the spectrometer.
A method of spectroscopically analyzing a material comprising:
- inserting a probe head of a spectrometer into the material along an insertion axis, the probe head emitting light at least generally perpendicular to the insertion axis,
- moving the probe head along the insertion axis within the material to irradiate, with the probe head, a sample volume of the material, the sample volume extending at least partially about the circumference of the probe head, and
- analyzing light reflected from the sample volume of material.
A probe head for use with a spectrometer to analyze a flowing material, the probe head comprising:
- a light source arranged to irradiate a sample volume of the flowing material proximate the probe head;
- an optical pick-up arranged to receive light emitted from the irradiated sample volume;
- and
- a planing element shaped to cause the probe head to skim the surface of the flowing material when in contact with the flowing material.
A probe assembly for use with a spectrometer to analyze a flowing material, the probe head comprising:
- a housing, having arranged therein, two or more probe heads for use with a spectrometer, wherein each of the probe heads are simultaneously able to irradiate and collect spectral information on the flowing material, and include
- (a) a light source arranged to irradiate a sample volume of the flowing material proximate the probe head, and
- (b) an optical pick-up arranged to receive light emitted from the irradiated sample volume;
- wherein the housing is shaped for disposal of the probe assembly in the path of the flowing material.
Dependencies are inferred from the claim text.