Method of analyzing crystalline texture
AssigneeOxford Instruments Analytical Oy
InventorsCheng Tsien Chou, Keith Graham Dicks, Pierre Rolland
Life of this patent
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AssigneeOxford Instruments Analytical Oy
InventorsCheng Tsien Chou, Keith Graham Dicks, Pierre Rolland
Estimating the term…
A method of analyzing crystalline texture from data defining the orientation of crystals in a sample of polycrystalline material including, for each crystal, determining the orientation of a first direction in the sample, with respect to a common reference frame fixed to the crystal structure of each crystal. A number of crystals sharing a similar orientation of the first direction with respect to the reference frame is selected and for each, the orientation is determined of a second direction in the sample with respect to the reference frame. A number of crystals sharing a similar orientation of the second direction with respect to the reference frame is selected and a crystal texture corresponding to the orientation of the selected crystals with respect to the first and second directions within the sample is determined and/or represented.
A method of analyzing crystalline texture from data defining the orientation of crystals in a sample of polycrystalline material, the method comprising:
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