Semiconductor memory device and method of selecting word line thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsChan-Yong Lee, Jung-Bae Lee
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AssigneeSamsung Electronics Co., Ltd.
InventorsChan-Yong Lee, Jung-Bae Lee
Estimating the term…
A semiconductor memory device includes a plurality of memory cell array blocks each including a plurality of partial blocks, a plurality of global word lines, and odd-numbered and even-numbered sub word lines corresponding to each of the plurality of the global word lines, the odd-numbered sub word lines of each of odd-numbered partial blocks among the plurality of the partial blocks, respectively, connected to the odd-numbered sub word lines of each of the previous neighboring partial blocks, the even-numbered sub word lines of each of the odd-numbered partial blocks among the plurality of the partial blocks, respectively, connected to the even-numbered sub word lines of each of the next neighboring partial blocks, the odd-numbered sub word lines of each of even-numbered partial blocks among the plurality of the partial blocks, respectively, connected to the odd-numbered sub word lines of each of the next neighboring partial blocks, the even-numbered sub word lines of each of the even-numbered partial blocks among the plurality of the partial blocks, respectively, connected to the even-numbered sub word lines of each of the previous neighboring partial blocks; and a control means for selecting sub word lines of a corresponding partial block and sub word lines of a neighboring partial block connected to the sub word lines of the corresponding partial block when the corresponding partial block is selected in response to externally applied row and column address.
A semiconductor memory device, comprising:
A semiconductor memory device, comprising:
A semiconductor memory device which includes
A method of selecting word lines of a semiconductor memory device including a memory cell array, the memory cell array including a plurality of partial blocks, a plurality of global word lines, and odd-numbered and even-numbered sub word lines corresponding to each of the plurality of global word lines, the method comprising:
A method of selecting word lines of a semiconductor memory device including a plurality of memory cell array blocks, each of the memory cell array blocks including a plurality of partial blocks, a plurality of global word lines, and a predetermined number of sub word lines corresponding to each of the plurality of the global word lines, the method comprising:
A semiconductor memory device, comprising:
A semiconductor memory device, comprising:
Dependencies are inferred from the claim text.