Feature formation in a nonphotoimagable material and switch incorporating same
AssigneeAgilent Technologies, Inc.
InventorsMarvin Glenn Wong, You Kondoh, John Ralph Lindsey
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsMarvin Glenn Wong, You Kondoh, John Ralph Lindsey
Estimating the term…
A first resist is deposited on at least a portion of a substrate (or existing feature on the substrate) that will underlie a feature in a nonphotoimagable material that is to be deposited on the substrate. Thereafter, the nonphotoimagable material is deposited so that it overlaps at least a portion of the first resist. A second resist is then deposited on at least a portion of the nonphotoimagable material, and a feature is patterned on the second resist. Subsequently, the part is sandblasted until the first resist is exposed, and the first and second resists are then removed. In one embodiment, the nonphotoimagable material is deposited on a channel plate and used to seal at least a switching fluid between the channel plate and another substrate.
A switch, produced by:
Dependencies are inferred from the claim text.