Method for forming a multilayer electrode for a ferroelectric capacitor
AssigneeMicron Technology, Inc.
InventorsVishnu K. Agarwal, Garo J. Derderian, F. Daniel Gealy
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AssigneeMicron Technology, Inc.
InventorsVishnu K. Agarwal, Garo J. Derderian, F. Daniel Gealy
Estimating the term…
A ferroelectric or high dielectric constant capacitor having a multilayer lower electrode comprising at least two layers—a platinum layer and a platinum-rhodium layer—for use in a random access memory (RAM) cell is disclosed. The platinum layer of the lower electrode is formed such that it adjoins the capacitor dielectric, which is a ferroelectric or high dielectric constant dielectric such as BST, PZT, SBT or tantalum pentoxide. The platinum-rhodium layer serves as an oxidation barrier and may also act as an adhesion layer for preventing separation of the lower electrode from the substrate, thereby improving capacitor performance. The multilayer electrode may have titanium and/or titanium nitride layers under the platinum-rhodium layer for certain applications. The capacitor has an upper electrode which may be a conventional electrode or which may have a multilayer structure similar to that of the lower electrode.
A method of forming a lower electrode for a capacitor, comprising the steps of:
A method of forming a capacitor, comprising the steps of:
A method of forming a capacitor, comprising the steps of:
A method of forming a capacitor, comprising the steps of:
Dependencies are inferred from the claim text.