High frequency compression mount receptacle with lineal contact members
AssigneePlastronics Socket Partners, Ltd.
InventorLarry S. Scott
Life of this patent
Estimating the term…
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AssigneePlastronics Socket Partners, Ltd.
InventorLarry S. Scott
Estimating the term…
A compression mount receptacles (16) is provided for mounting test and burn-in sockets (14) to surface mount pads of circuit boards (18). The receptacle (16) includes coil spring contacts (52) having active portions provided by loosely wound coils (54) which provide compliance for accommodating tolerances and changes in distances between the test and burn-in sockets (14) and the circuit boards (18). The coil spring contacts (52) further include first and second end portions (56, 58), with some of the end portions (56) being formed of close wound coils in which adjacent coils are in contact to provide lineal circuit paths. Conductive contact tangs (60) extend within respective ones of the coil spring contacts (52) and provide substantially lineal circuit paths which electrically connect between respective ones of first and second electrical contacts (22, 20), providing a shortened contact circuit across the loosely wound coils (54) of the coil spring contacts (52).
An apparatus for electrically connecting first contacts to respective ones of second contacts, the apparatus comprising:
An apparatus for electrically connecting first contacts to respective ones of second contacts, the apparatus comprising:
An apparatus for electrically connecting first contacts to respective ones of second contacts, the apparatus comprising:
An apparatus for electrically connecting first contacts to respective ones of second contacts, the apparatus comprising:
A test socket for receiving electronic components and electrically connecting first contacts of the components to respective ones of second contacts of test circuitry, the test socket comprising:
A test socket for receiving electronic components and electrically connecting first contacts of the components to respective ones of second contacts of test circuitry, the test socket comprising:
A method for receiving electronic components in a test socket and electrically connecting first contacts of the components to respective ones of second contacts of test circuitry, the method comprising the steps of:
A method for receiving electronic components in a test socket and electrically connecting first contacts of the components to respective ones of second contacts of test circuitry, the method comprising the steps of:
An apparatus for electrically connecting a first contact to a second contact, the apparatus comprising:
Dependencies are inferred from the claim text.