Ion trapping
AssigneeYeda Research and Development Co. Ltd.
InventorsDaniel Zajfman, Oded Heber, Henrik B. Pedersen, Yinon Rudich, Irit Sagi, Michael Rappaport
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AssigneeYeda Research and Development Co. Ltd.
InventorsDaniel Zajfman, Oded Heber, Henrik B. Pedersen, Yinon Rudich, Irit Sagi, Michael Rappaport
Estimating the term…
A method for trapping of a plurality of charged particles in a charged particle trap. The trap includes first and second electrode mirrors having a common optical axis, the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The method includes introducing into the trap, along the optical axis, the plurality of charged particles as a beam having pre-determined key beam parameters. The method further includes choosing the key field parameters for at least one of the mirrors such as to induce bunching among charged particles in the beam.
A method for trapping of a plurality of charged particles in a charged particle trap including first and second electrode mirrors having a common optical axis, and arranged in alignment at two extremities of the particle trap, the mirrors being capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters and configured to reflect charged particles causing oscillation of the particles between the mirrors, said method comprising the steps of:
Dependencies are inferred from the claim text.