Systems and methods for tagging measurement values
AssigneeAgilent Technologies, Inc.
InventorsMichael T. McTigue, Allen Montijo
Life of this patent
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Abstract
Systems and methods for measuring a characteristic of an analog signal are provided. A system for measuring a characteristic of an analog signal includes an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value, and logic that is configured to associate a data tag with the data value.
Claims52
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUL;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- wherein at least one of the receiving, converting, and associating is implemented with a member of a group consisting of:
- an oscilloscope, a spectrum analyzer, a logic analyzer, a vector analyzer, a network analyzer, and a time interval analyzer.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- filtering the data value based on a value of the data tag.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- modifying the data value based on a value of the data tag.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- routing the data value based on a value of the data tag.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- displaying a graph that includes a point that represents the data value.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- determining whether the data value is a peak value.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- accumulating statistical information based on a value of the data tag.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- decimating a plurality of data values that include the data value.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- wherein the characteristic of the analog signal is one of a light level, a frequency, a phase, a time interval, and a vector.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- wherein the data tag identifies an input channel for the analog signal.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- wherein the data tag identifies whether the data value is a peak value.
A method for measuring a characteristic of a device under test (DUT), the method comprising:
- receiving an analog signal from the DUT;
- converting the analog signal into a digital form that includes at least one digital data value that measures a characteristic of the DUT;
- and
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- wherein the data tag identifies whether the data value is a decimated data value.
A method for testing a device under test (DUT), comprising:
- receiving a data value that measures a characteristic of an analog signal;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- filtering the data value based on a value of the data tag.
A method for testing a device under test (DUT), comprising:
- receiving a data value that measures a characteristic of an analog signal;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- modifying the data value based on a value of the data tag.
A method for testing a device under test (DUT), comprising:
- receiving a data value that measures a characteristic of an analog signal;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- routing the data value based on a value of the data tag.
A method for testing a device under test (DUT), comprising:
- receiving a data value that measures a characteristic of an analog signal;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- displaying a graph that includes a point that represents the data value.
A method for testing a device under test (DUT), comprising:
- receiving a data value that measures a characteristic of an analog signal;
- associating a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- accumulating statistical information based on a value of the data tag.
A measurement and testing instrument (MTI) comprising:
- an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value that measures a characteristic of the analog signal;
- and
- logic that is configured to associate a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- wherein the MTI is a member of a group consisting of:
- an oscilloscope, a spectrum analyzer, a logic analyzer, a vector analyzer, a network analyzer, and a time interval analyzer.
A measurement and testing instrument (MTI) comprising:
- an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value that measures a characteristic of the analog signal;
- logic that is configured to associate a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- a display screen that is configured to display a point that corresponds to the data value.
A measurement and testing instrument (MTI) comprising:
- an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value that measures a characteristic of the analog signal;
- logic that is configured to associate a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- a data splitting module that is configured to route the data value based on a value of the data tag.
A measurement and testing instrument (MTI) comprising:
- an analog to digital converter that is configured to convert an analog signal into a digital form that includes at least one digital data value that measures a characteristic of the analog signal;
- logic that is configured to associate a data tag with the data value, wherein the data tag identifies one or more characteristics of the data value;
- and
- a data reduction module that is configured to decimate a plurality of data values that include the data value.
Dependencies are inferred from the claim text.