Loading patent…
AssigneeInternational Business Machines Corporation
InventorsUlrich Baur, Otto Andreas Torreiter, Joseph Eckelman, David TinSun Hui
Estimating the term…
The present invention relates to a method and system for full parametric testing of the drive and receive capability of bi-directional driver/receiver-stages, and in particular of bi-directional input/output-stages of a semiconductor chip. Electrical properties, as for example DC-resistance, AC-impedance of a driver stage are tested by at least one test load implemented on the chip itself which causes a characteristic voltage drop usable for test evaluation. Advantageously, the output stage devices of P-type (50, 52) and N-type (54, 56), respectively, are split into at least two sub-devices P1, P2 and N1, N2, and are controlled separately by a control logic (60, 62, 64, 70, 72, 74). Then, for example N2 is used for testing the P device, and P2 is used for testing the N-device. Thus, devices already present on the chip are re-used for test purposes, which makes off-chip testing unnecessary.
A method for fall parametric testing the drive capability and the receive capability of an input/output (I/O) stage implemented in an integrated circuit chip, comprising the step of:
A hardware chip comprising at least one test load implemented on-chip for determining electrical properties of an output stage, the test load being selectively controllable according to a predetermined on-chip test scheme for forming an asymmetric voltage divider circuit comprising a subset of a plurality of driving transistor devices in which the test load causes a characteristic voltage drop usable for test evaluation.
A computer program product for execution in a data processing system comprising computer program code portions for performing respective steps of a method for frill parametric testing the drive capability and the receive capability of an input/output (I/O) stage implemented in an integrated circuit chip, the method comprising:
A computer program product stored on a computer usable medium comprising computer readable program code portions for causing a computer to perform a method for full parametric testing the drive capability and the receive capability of an input/output (I/O) stage implemented in an integrated circuit chip when said computer readable program code portions are executed on the computer, the method comprising:
Dependencies are inferred from the claim text.