Bias structure for magnetic tunnel junction magnetoresistive sensor
AssigneeHitachi Global Storage Technologies Netherlands B.V.
InventorHardayal Singh Gill
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AssigneeHitachi Global Storage Technologies Netherlands B.V.
InventorHardayal Singh Gill
Estimating the term…
An antiparallel (AP)-pinned magnetoresistive tunnel junction (MTJ) sensor is provided with a single antiferromagnetic (AFM) layer sandwiched between an AP-pinned layer and a bias layer for pinning the magnetization directions of the AP-pinned layer and the bias layer. The bias layer may be a simple ferromagnetic bias layer or, alternatively, may be an AP-pinned bias layer including first and second ferromagnetic bias layers with an antiferromagnetic coupling layer sandwiched between. The bias layer provides a demagnetization field HdmB at the free layer having the same direction as the demagnetization field HdmP from the AP-pinned layer. The sum of HdmP and HdmB counterbalance a ferromagnetic coupling field HFC from the AP-pinned layer to obtain zero or near zero asymmetry of the bias point on the transfer curve of the MTJ sensor.
A magnetic tunnel junction (MTJ) magnetoresistive sensor, comprising:
A magnetic tunnel junction (MTJ) magnetoresistive sensor which has positive and negative readback signals about a bias point of a transfer curve upon sensing positive and negative magnetic incursions from a moving magnetic medium, said MTJ sensor comprising:
A magnetic read/write head comprising:
A magnetic read/write head comprising:
A disk drive system comprising:
A disk drive system comprising:
A disk drive system comprising:
A disk drive system comprising:
Dependencies are inferred from the claim text.