Tester and testing method for differential data drivers
AssigneeSharp Kabushiki Kaisha
InventorsKoji Isodono, Toyohiko Tanaka, Hitoshi Imai, Hitoshi Saitoh
Life of this patent
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Abstract
A pair of resistors, having substantially equivalent resistance are arranged in series so that two data output lines of a differential data driver are connected to the ends of the series of resistors, the potentials of the two output signals ((D+)data output signal and (D−)data output signal) from the differential data driver are resistively divided to detect the sum of the potentials of the two signals. Based on the voltage of the combined signal, the acceptability of the differential signals of the differential data driver is determined.
Claims7
A tester apparatus for testing differential data drivers, comprising:
- input terminals for receiving at least two differential signals outputted from a differential output driver;
- a first tester circuit;
- and
- a second tester circuit connected to the first tester circuit, the first and second tester circuits directly receiving the at least two differential signals,
- wherein the acceptability of the at least two differential signals from the differential output driver is determined based on the sum of the voltages of the two signals.
A testing method for differential data drivers, comprising:
- receiving at input terminals at least two differential signals from a differential output driver, the at least two differential signals flowing directly into a first and second tester circuit;
- detecting the sum of the voltages of the at least two differential signals in the first tester circuit and feeding the result to the second testing circuit;
- wherein the acceptability of the two differential signals from the differential output driver is determined based on the sum of the voltages of the two signals.
Dependencies are inferred from the claim text.