Method for forming multi-layer wiring structure
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsHiroyuki Iida, Kazuto Ohbuchi, Atsushi Matsushita, Yoshio Hagiwara
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsHiroyuki Iida, Kazuto Ohbuchi, Atsushi Matsushita, Yoshio Hagiwara
Estimating the term…
For suppressing decomposition of an organic group (for example, a CH3 group) which is bonded to an Si atom of an organic SOG film for use in a flattening process at the time of an ashing process, there is provided a method comprising the steps of: forming an organic SOG layer directly on a lower wiring layer or on a predetermined film including a hillock protection layer which is formed on the lower wiring layer in advance; forming an upper wiring layer on the organic SOG layer without using an etching back process; forming a via hole through an etching process by using a patterned resist layer provided on the upper wiring layer as a mask; performing an ashing process with a plasma by making ions or radicals which are induced from oxygen gas as a main reactant, under an atmospheric pressure ranging from 0.01 Torr to 30.0 Torr; and filling said via hole with a conductive material so as to electrically connect the lower wiring layer to the upper wiring layer.
A method for forming a multi-layer wiring structure, wherein a lower wiring layer and an upper wiring layer are electrically connected through a via hole, comprising the following steps of:
Dependencies are inferred from the claim text.