Method of erasing flash memory cells
AssigneeHynix Semiconductor Inc.
InventorsSung Mun Jung, Jum Soo Kim
Life of this patent
Estimating the term…
Loading patent…
AssigneeHynix Semiconductor Inc.
InventorsSung Mun Jung, Jum Soo Kim
Estimating the term…
The present invention relates to a method of erasing flash memory cells. In the flash memory cell having a substrate, a source, a drain, a tunnel oxide film, a floating gate, a dielectric film and a control gate, the method of erasing the flash memory cell comprises the steps of performing an erase operation for the cell, by applying a negative voltage being an erase voltage to the control gate and a positive voltage being an erase voltage to the substrate, discharging the control gate by making the control gate grounded, discharging the source by making the source grounded, and simultaneously performing a discharge operation and a recovery operation by making the substrate grounded. Therefore, the threshold voltages of the cells can be converted to have a constant voltage even though additional recovery operation is not performed.
A method of erasing a flash memory cell having a substrate, a source, a drain, a tunnel oxide film, a floating gate, a dielectric film and a control gate, comprising the steps of:
A method of erasing a flash memory cell having a substrate, a source, a drain, a tunnel oxide film, a floating gate, a dielectric film and a control gate, comprising the steps of:
Dependencies are inferred from the claim text.