Parallel displacement/inclination measuring apparatus and antenna system
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorYukihiro Honma
Life of this patent
Estimating the term…
Abstract
A laser pointer and an image sensor are employed as one measuring system, and two measuring systems are arranged such that a laser beam is irradiated in the opposite direction. One laser pointer and one image sensor are arranged on the measuring reference portion, and also One laser pointer and one image sensor are arranged on the measured portion. The parallel displacement ΔX and the inclination θ of the measured portion are calculated separately based on measured results obtained by these two measuring systems.
Claims6
A parallel displacement/inclination measuring apparatus, comprising:
- a first marker for indicating a position provided to a measuring reference portion;
- a first image sensor provided to a measured portion to oppose to said first marker;
- a second marker for indicating a position provided to the measured portion;
- a second image sensor provided to the measuring reference portion to oppose to said second marker;
- a position calculating portion for calculating positions of said first marker and said second marker, which are picked up by said first image sensor and said second image sensor;
- and
- a displacement/inclination calculating portion for calculating a parallel displacement and an inclination of the measured portion, based on the positions of said first marker and said second marker calculated by the position calculating portion.
An antenna system comprising:
- an antenna pedestal for supporting an elevation angle driving axis of an antenna;
- a first marker for indicating a position provided to a top portion of said antenna pedestal;
- a first image sensor provided to a bottom portion of said antenna pedestal to oppose to said first marker;
- a second marker for indicating a position provided to the bottom portion of said antenna pedestal;
- a second image sensor provided to the top portion of said antenna pedestal to oppose to said second marker;
- a position calculating portion for calculating positions of said first marker and said second marker, which are picked up by said first image sensor and said second image sensor;
- and
- a displacement/inclination calculating portion for calculating a parallel displacement and an inclination of the top portion of said antenna pedestal, based on the positions of said first marker and said second marker calculated by the position calculating portion.
An antenna system comprising:
- an antenna pedestal for supporting an elevation angle driving axis of an antenna;
- first markers for indicating positions provided to right and left portions of a top portion of said antenna pedestal respectively;
- first image sensors provided to right and left portions of a bottom portion of said antenna pedestal respectively to oppose to said first markers;
- second markers for indicating positions provided to right and left portions of the bottom portion of said antenna pedestal respectively;
- second image sensors provided to right and left portions of the top portion of said antenna pedestal respectively to oppose to said second markers;
- a position calculating portion for calculating positions of said first markers and said second markers, which are picked up by said first image sensors-and said second image sensors;
- a displacement/inclination calculating portion for calculating parallel displacements and inclinations of the right and left portions of the top portion of said antenna pedestal, based on the positions of said first markers and said second markers calculated by the position calculating portion;
- and
- a pointing error calculating portion for calculating an antenna pointing error based on the parallel displacements and the inclinations of the right and left portions of the top portion of said antenna pedestal calculated by the displacement/inclination calculating portion.
Dependencies are inferred from the claim text.