US 6,720,791 B2Granted

LCD testing method

AssigneeHannstar Display Corp.

InventorsJia-Shyong Cheng, Chia-Yu Wang, Shing-shiang Chang

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Abstract

An LCD panel testing method. The method comprises forming jump lines in a predetermined region on the substrate between the signal lines via mask design when forming TFT LCD arrays, and thus forming a plurality of signal-line groups each with two signal lines coupled by the jump lines. Thereupon, an array tester sequentially tests two pixels corresponding to the signal lines in the signal groups. If one of the feedback signals from the signal groups does not meet a predetermined standard, it is determined that one or both pixels in the signal group are defective. The defective pixel or pixels are then identified using an electronic microscope to test two pixels at the same time. In this way, the number of probe pins and tests performed is halved. The probe pin size is also thus less restrictive due to larger probe pin intervals. Consequently, yield is greatly increased.

Claims8

Dependent claims

An LCD panel testing method, used to test a plurality of pixel units in an LCD panel having a plurality of corresponding gate lines and n signal lines Pi˜Pn the method comprising:

providing a substrate;
providing an LCD panel on the substrate, having the signal lines Pi˜Pn sequentially arranged on one side of the LCD panel;
dividing the signal lines Pi˜Pn to form a plurality of signal-line groups, each signal-line group comprising at least two of the signal lines connected together by a jump line;
providing a sacrifice area on the substrate to couple the signal lines in the signal-line groups, wherein the jump line is formed in the sacrifice area and is formed together with the LCD panel on the substrate by sequentially lithography and etching;
and
providing a testing device, having a plurality of first probe tips and a plurality of second probe tips, wherein the first probe tips are respectively coupled to the gate lines, and the second probe tips are respectively coupled to the signal-line groups so that the testing device sequentially test the pixel units corresponding to one of the gate lines and one of the signal-line groups.

3 more elements

Dependencies are inferred from the claim text.