Device for testing electronic devices
AssigneeHeatron, Inc.
InventorsRobert H. Martter, Craig C. Sundberg, Richard N. Giardina, Brian S. Fetscher, G. James Deutschlander
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Abstract
An electric circuit board to test electronic devices at elevated temperatures. The board comprises a steel base having a dielectric coating layer and a circuit formed on the layer. The circuit includes a connector region for attachment to an external electrical source and a mounting region for mounting sockets for supporting, powering and monitoring the electronic devices during elevated temperature testing. The board displays a leakage current of less than 10μ Amps at 350° C.
Claims9
A burn-in board for use In testing semiconductor chips at elevated temperatures comprising a steel base having a dielectric coating formed thereon, said dielectric coating having a circuit formed thereon, said circuit having a connector region for attachment to an external electrical source and a mounting region for mounting sockets for supporting said chips, said burn-in board having a leakage current of less than 10μ Amps at 350° C.
Dependencies are inferred from the claim text.