Circuit board tester probe system
Assigneeatg test systems GmbH & Co. KG
InventorsBernd Ott, Manfred Prokopp
Life of this patent
Estimating the term…
Abstract
A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.
Claims42
A probe for a circuit board tester comprising
- a needle with an outer wall;
- a sleeve with a sleeve inner wall surrounding at least a portion of the outer wall of the needle to guide the needle;
- and
- a spring being provided in said sleeve which counteracts movement of said needle;
- wherein said needle protrudes more than 10 millimeters (mm) from said sleeve, has a maximum diameter (d2) of less than 0.30 mm, and tapers to a contact tip from the sleeve;
- and
- wherein the probe is installed in a circuit board tester comprising:
- a regular grid pattern array;
- and
- an adapter including at least two layers in parallel with each other, a first side contact of the probe being in electrical contact with and adapted to a contact arrangement on said grid pattern array, wherein said contact tip of said probe protrudes from a second side, whereby the contact tip is assigned to a specific circuit board test point of a test object and is in electrical contact with said circuit board test point of a test object inserted in said tester.
An adapter comprising:
- at least two layers in parallel with each other;
- probes, each comprising a needle with an outer wall, a sleeve with a sleeve inner wall surrounding at least a portion of the outer wall of the needle to guide the needle;
- and a spring being provided in said sleeve that counteracts movement of said needle, wherein said needle protrudes more than 10 millimeters (mm) from said sleeve, has a maximum diameter (d2) of less than 0.30 mm, and tapers to a contact tip from the sleeve, wherein the probes are mounted in through-holes in said layers, said probes being arranged partly canting relative to said layers and having protruding contact tips for contacting a test object, an end of said probes opposite said contact tips being adapted to contact a grid pattern array with a regular arrangement of contacts that the probes engage.
A circuit board tester comprising:
- a regular grid pattern array;
- and
- an adapter including several probes having contact tips, at least two layers in parallel with each other, first side contacts in electrical contact with said probes, which are adapted to a contact arrangement on said grid pattern array, wherein said contact tips of said probes protrude from a second side, whereby each of said contact tips is assigned to a specific circuit board test point of a test object and is in electrical contact with said circuit board test point of a test object inserted in said tester.
A probe for a circuit board tester comprising
- a needle;
- a sleeve surrounding at least a portion of the needle to guide the needle;
- and
- a spring being provided in said sleeve which counteracts movement of said needle;
- wherein said needle at least sometimes protrudes more than 10 millimeters from said sleeve, has a maximum diameter of less than 0.30 millimeters, and tapers to a contact tip;
- wherein the probe is installed in a circuit board tester comprising:
- a regular grid pattern array;
- and
- an adapter including at least two layers in parallel with each other, a first side contact of the probe being in electrical contact with and adapted to a contact arrangement on said grid pattern array, wherein said contact tip of said probe protrudes from a second side, whereby the contact tip is assigned to a specific Circuit board test point of a test object and is in electrical contact with said circuit board test point of a test object inserted in said tester.
Dependencies are inferred from the claim text.