Method and apparatus for generating jitter test patterns on a high performance serial bus
AssigneeApple Computer, Inc.
InventorColin Whitby-Strevens
Life of this patent
Estimating the term…
Abstract
The present invention provides a method for generating random jitter test patterns by generating a sequence of maximum-size asynchronous packets according to the P1394b standard and transmitting the sequence to the device under test. The present invention provides a method for generating jitter test patterns by disabling the transmitter data scrambler of the second device; clearing the port_error register of the device under test; and sending a test pattern to said device under test. The present invention provides for a method for generating supply noise test patterns comprising: transmitting a test pattern to the DUT comprising a maximum length asynchronous packet containing alternate 0016 and FF16 bytes.
Claims11
In a P1394b-compliant data communications system having a device under test operatively coupled to second device, a method for generating random jitter test patterns comprising:
- generating, by the second device, a sequence of maximum size asynchronous packets according to the P1394b standard;
- and
- transmitting, by said second device, said sequence to the device under test.
In a P1394b-compliant data communications system having a device under test operatively coupled to second device, the device under test having a port_error register and the second device having a data scrambler, a method for generating jitter test patterns comprising:
- disabling the transmitter data scrambler of the second device;
- clearing the port_error register of the device under test;
- sending, by said second device, a test pattern to said device under test;
- and
- reading the port_error register of the device under test.
Dependencies are inferred from the claim text.