Test data generating system and method to test high-speed actual operation
AssigneeFujitsu Limited
InventorHitoshi Watanabe
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AssigneeFujitsu Limited
InventorHitoshi Watanabe
Estimating the term…
A test data generating system and method to conduct high-speed operation (actual operation test of an LSI using a tester. The system converts existing simulation data to high-speed operation verifying test data which is formed to obtain a predetermined output expectation value after a clock signal is stopped for a predetermined period. The test data generating system includes a selecting device to select first output expectation values from simulation data and an inserting device to insert output expectation values, which are identical to a predetermined number of the first expectation values, after the first output expectation values. The system also inserts an input pattern, which is identical to a predetermined number of the input patterns, after the input pattern corresponding to the first output expectation value. A replacing device replaces the predetermined output expectation values of the simulation data with third output expectation values, and a setting device sets the first output expectation values to second output expectation values determined from the simulation data based on the predetermined number or the third output expectation values.
A test data generating method, comprising:
A computer readable storage medium encoded with processing instructions for performing test data generation with a computer, comprising:
A computer readable storage medium encoded with processing instructions for implementing a test data generating method with a computer, the method comprising:
An apparatus, comprising:
A test data generating system, comprising:
Dependencies are inferred from the claim text.