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US 6,715,118 B2Granted
Configuration for generating signal impulses of defined lengths in a module with a bist-function
AssigneeInfineon Technologies AG
InventorsRobert Kaiser, Hans-Jürgen Krasser, Florian Schamberger, Helmut Schneider
Life of this patent
Estimating the term…
Abstract
In the configuration, the module can “learn” one or more time intervals from the external tester and then repeat them internally or compare them to its own internally measured time intervals, for instance, for the purpose of evaluating whether the module in question has crossed a time specification value or remains below the value. The module can also measure and store one or more internal time intervals and transmit them to the external tester in digital or analog form.
Claims4
In a module with a BIST function, a configuration comprising:
- a variable delay element configured for obtaining measured pulse lengths by measuring pulse lengths of signal pulses being supplied by an external tester, said variable delay element including a plurality of inverters connected in series;
- a plurality of registers, each one of said plurality of registers for storing a respective one of said measured pulse lengths;
- a delay-free write signal path for writing to said plurality of registers;
- and
- a delay-free read-out signal path for reading out said plurality of registers;
- said delay-free signal write path and said delay-free read-out signal path configured parallel to said plurality of inverters of said variable delay element.
3 more elements
Dependencies are inferred from the claim text.