Sensor structures and methods for reduction of differential-heating signal errors in integrated circuits

A method of reducing differential-heating signal errors along a differential signal path, the method comprising the steps of:

• coupling first and second transistors to different sides of said differential signal path;
• and
• providing a differential correction signal to said differential signal path in differential response to a differential error signal generated by like terminals of said first and second transistors;
• further including the step of establishing respective bias parameters for at least one set of same terminals of said first and second transistors that differ from said like terminals;
• wherein said first and second transistors are metal-oxide semiconductor transistors, said like terminals are sources, same terminals of one set are drains and their respective bias parameter is current, and same terminals of another set are gates and their respective bias parameter is voltage.

A correction sensor for reduction of differential-heating signal errors along a differential signal path the sensor comprising:

• first and second transistors coupled to different sides of said differential signal path;
• and
• a differential error amplifier that couples a differential correction signal to said differential signal path in differential response to a differential error signal generated by like terminals of said first and second transistors;
• further including a bias generator which biases at least one set of same terminals of said first and second transistors that differ from said like terminals:
• wherein:
• said first and second transistors are bipolar junction transistors and said like terminals are emitters;
• same terminals of one set are collectors and a respective bias generator is at least one current source;
• and
• same terminals of another set are bases and a respective bias generator is a voltage source.

A correction sensor for reduction of differential-heating signal errors along a differential signal path of the sensor comprising:

• first and second transistors coupled to different sides of said differential signal path;
• and
• a differential error amplifier that couples a differential correction signal to said differential signal path in differential response to a differential error signal generated by like terminals of said first and second transistors;
• further including a bias generator which biases at least one set of same terminals of said first and second transistors that differ from said like terminals;
• wherein:
• said first and second transistors are metal-oxide semiconductor transistors and said like terminals are sources;
• same terminals of one set are drains and a respective bias generator is at least one current source;
• and
• same terminals of another set are gates and a respective bias generator is a voltage source.

An amplifier of comprising:

• a differential amplifier that processes a differential signal along a differential signal path;
• and
• a correction sensor that has first and second transistors coupled to different sides of said differential signal path and a differential error amplifier that couples a differential correction signal to said differential signal path in differential response to a differential error signal generated by like terminals of said first and second transistors;
• wherein said first and second transistors are bipolar junction transistors and said like terminals are emitters of said bipolar junction transistors;
• differential-heating signal errors of said differential amplifier thereby reduced by said sensor.

An amplifier, comprising:

• a differential amplifier that processes a differential signal along a differential signal path;
• and
• a correction sensor that has first and second transistors coupled to different sides of said differential signal path and a differential error amplifier that couples a differential correction signal to said differential signal path in differential response to a differential error signal generated by like terminals of said first and second transistors;
• wherein said first and second transistors are metal-oxide semiconductor transistors and said like terminals are sources of said metal-oxide semiconductor transistors;
• differential-heating signal errors of said differential amplifier thereby reduced by said sensor.

A pin electronics system for testing of a device-under-test (DUT) at a DUT system port, comprising:

• a pin driver that applies an excitation signal to said system port;
• an active load that provides a load to said system port;
• and
• a comparator coupled to said system port to compare a response signal of said DUT to a predetermined reference signal;
• wherein at least one of said pin driver, active load and comparator includes:
• a) a differential pair of transistors positioned to process a differential signal along a differential signal path;
• b) first and second transistors coupled to different sides of said differential signal path;
• and
• c) a differential error amplifier that couples a differential correction signal to said differential signal path in differential response to a differential error signal generated by like terminals of said first and second transistors;
• differential-heating signal errors of said differential pair thereby reduced by said sensor.