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US 6,714,034 B2Granted
Integrated circuit testing apparatus having stable ground reference
OwnerAndy Cheninventor
Life of this patent
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Abstract
An IC testing apparatus includes a testing board having at least one testing region and a plurality of signal grounds thereon, and at least one inductive magnetic device. The testing apparatus is for generating a new DUT reference ground by connecting the inductive magnetic device with the signal ground of the testing region.
Claims3
An integrated circuit testing apparatus having a stable ground reference comprising:
- a testing board including at least one testing region defined thereon, said testing region having at least a first signal ground and a second signal ground formed thereon;
- and,
- at least one inductive magnetic device connected between said first and second signal grounds, said first signal ground forming a reference ground for connection to a device under test.
Dependencies are inferred from the claim text.