US 6,714,021 B2 · Integrated time domain reflectometry (TDR) tester

Abstract

An integrated TDR for locating transmission line faults. An integrated circuit comprises a transmitter, a path coupled to the transmitter, and a TDR receiver integrated with the transmitter for analyzing a reflected signal from the path. The TDR receiver compares the reflected signal with a variable reference signal to generate a logic state at a sampling instant determined by a timebase generated by a sampling circuit. The reflected signal equals the variable reference signal when the logic state transitions. The reference signal and the corresponding timebase value are recorded at the logic state transition. A waveform is generated from the recorded reference signal and its corresponding timebase value. A reference point for the waveform is determined. The location of a fault on the transmission line can be determined from the timebase value difference between the reference point and the fault.

Claims17

Dependent claims

A computer system comprising:

a centerplane;
a first backplane coupled to the centerplane;
and
a second backplane coupled to the centerplane;
wherein the first backplane can communicate with the second backplane through the centerplane;
wherein the first backplane includes a time domain reflectometer transmitter and a time domain reflectometer receiver that are configured to determine a fault location on the first backplane, the fault location not being on a wire shielded within a protective tube.

3 more elements

Dependencies are inferred from the claim text.

Integrated time domain reflectometry (TDR) tester

Life of this patent

Integrated time domain reflectometry (TDR) tester

Life of this patent

Abstract

Claims17