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AssigneesCandescent Technologies Corporation, Candescent Intellectual Property Services, Inc.
InventorsMarius Enachescu, Sergey Belikov, Stephen F. Meier
Estimating the term…
A method and system for detecting electrical short circuit defects in a plate structure of a flat panel display, for example, a field emission display (FED) is disclosed. In one embodiment, the process first applies a stimulation to the electrical conductors of the plate structure. Next, the process creates an infra-red thermal mapping of a cathode region of the FED. For example, an infra-red array may be used to snap a picture of the cathode of the FED. Then, the process analyzes the infra-red thermal mapping to determine a region of the FED which contains the electrical short circuit defect. Another embodiment localizes the defect to one sub-pixel by performing an infra-red mapping of the region which the previous IR mapping process determined to contain the electrical short circuit defect. Then, the process analyzes this infra-red mapping to determine a sub-pixel of the FED which contains the electrical short circuit defect.
A method of Infra-red thermal detection of a defect in a plate structure of a flat panel display comprising the steps of:
A system for identifying electrical short circuit defects in a plate structure of a flat panel display comprising:
In a computer system having a processor coupled to a bus, a computer readable medium coupled to said bus and having stored therein a computer program that when executed by said processor causes said computer system to implement a method of Infra-red thermal detection of an electrical short circuit defect in a field emission display (FED) comprising the steps of:
Dependencies are inferred from the claim text.