Linear motors and stages comprising same that produce reduced magnetic fields at an optical axis for charged-particle-beam lithography
AssigneeNikon Corporation
InventorAtsushi Yamada
Life of this patent
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AssigneeNikon Corporation
InventorAtsushi Yamada
Estimating the term…
Stages are disclosed for holding, e.g., a reticle or substrate while performing charged-particle-beam (CPB) lithography involving the reticle or substrate. The subject stages include at least one linear motor and exhibit reduced adverse effects at an optical axis of magnetic fields generated by the linear motor(s). In one configuration, a stage-driving permanent magnet is split into two magnet subunits that are situated equidistantly from the optical axis. This configuration allows each of the subunits to be situated farther from the optical axis than the single magnet used in a conventional stage. Because the magnitude of a magnetic field generated by a permanent magnet generally is inversely proportional to the square of the distance from the permanent magnet, increasing the distance of the magnet from the optical axis reduces the magnitude of the magnetic field, generated by the permanent magnet, at the optical axis. Various symmetrical configurations of magnet subunits, and of magnet subunits with associated dummy permanent magnets are disclosed.
A stage assembly for a charged-particle-beam (CPB) lithographic exposure system, comprising:
A stage assembly for a CPB lithographic exposure system, comprising:
A stage assembly for a CPB lithographic exposure system, comprising:
A stage assembly for a CPB lithographic exposure system, comprising:
In a method for performing lithographic exposure of a pattern onto a substrate using a charged particle beam passing through a charged-particle-beam (CPB) optical system of a CPB lithographic exposure apparatus that includes a stage extending in an X-Y plane and driven in an X-axis or Y-axis direction by a linear motor, a method for reducing the magnitude of a magnetic field produced by the linear motor at an optical axis of the CPB optical system, the optical axis being perpendicular to the X-Y plane, the method comprising:
In a method for performing lithographic exposure of a pattern onto a substrate using a charged particle beam passing through a charged-particle-beam (CPB) optical system of a CPB lithographic exposure apparatus that includes a stage extending in an X-Y plane and driven in an X-axis or Y-axis movement direction by a moving-coil linear motor, a method for reducing the magnitude of a magnetic field produced by the linear motor at an optical axis of the CPB optical system, the optical axis being perpendicular to the X-Y plane, the method comprising:
In a method for performing lithographic exposure of a pattern onto a substrate using a charged particle beam passing through a charged-particle-beam (CPB) optical system of a CPB lithographic exposure apparatus that includes a stage extending in an X-Y plane and driven in an X-axis or Y-axis movement direction by a moving-magnet linear motor, a method for reducing the magnitude of a magnetic field produced by the linear motor at an optical axis of the CPB optical system, the optical axis being perpendicular to the X-Y plane, the method comprising:
In a method for performing lithographic exposure of a pattern onto a substrate using a charged particle beam passing through a charged-particle-beam (CPB) optical system of a CPB lithographic exposure apparatus that includes a stage extending in an X-Y plane and driven in an X-axis or Y-axis movement direction by first and second respective moving-magnet linear motors, a method for reducing the magnitude of a magnetic field produced by the linear motors at an optical axis of the CPB optical system, the optical axis being perpendicular to the X-Y plane, the method comprising:
Dependencies are inferred from the claim text.