Method of sensing temperature of a digital X-ray imaging system

A method for directly controlling temperature of a detector panel of an X-ray imaging system having a plurality of photodiodes comprising:

• providing a conditioner unit and a processing circuit and a coldplate, wherein said conditioner unit is fluidically coupled to said coldplate and electronically coupled to said processing circuit;
• measuring an offset images value for at least one of the plurality of photodiodes of the detector panel taken for at least two known temperatures without X-ray;
• extrapolating an offset image versus temperature curve for each of said measured offset image values for each of said at least one of the plurality of photodiodes;
• storing said extrapolated offset image versus temperature curve for each of said plurality of photodiodes within said processing circuit;
• determining the temperature of the detector panel immediately alter use of the X-ray imaging system by measuring a second offset image value taken without an X-ray for said at least one of said plurality of photodiodes and comparing said second offset image value to said offset image versus temperature curve;
• and
• directing an electrical signal from said processing circuit to said conditioner unit that correlates to the temperature of said detector panel determined from said second offset value, said electrical signal used by said conditioner wilt to control the temperature of coolant flowing to said coldplate to maintain said detector panel within a operating temperature range.

An X-ray imaging system having a closed-loop cooling system comprising:

• a detector panel having a plurality of photodiodes;
• a coldplate closely coupled with said detector panel;
• a processing circuit electrically coupled with at least one of said plurality of photodiodes said processing circuit capable of producing a signal representing the temperature of the detector panel as measured immediately after the acquisition of an X-ray by the X-ray imaging system by measuring the amount of dark current generated by said at least one of said plurality of photodiodes and determining the temperature of said detector panel located near said at least one of said plurality of photodiodes as a function of said amount of dark current;
• and
• a conditioner unit fluidically coupled with said coldplate and electrically coupled with said processing circuit, said conditioner unit capable of maintaining said detector panel within an operating temperature range.