Calibration for vector network analyzer
AssigneeTektronix, Inc.
InventorsThomas C. Hill, Xiaofen Chen, Soraya J. Matos, Leroy J. Willmann, Kyle L. Bernard, Linley F. Gumm
Life of this patent
Estimating the term…
Loading patent…
AssigneeTektronix, Inc.
InventorsThomas C. Hill, Xiaofen Chen, Soraya J. Matos, Leroy J. Willmann, Kyle L. Bernard, Linley F. Gumm
Estimating the term…
An improved calibration method for a vector network analyzer stores sparse calibration data, interpolates system error data from the sparse calibration data for each measurement by the vector network analyzer, and creates calibrated measurement data from the system error data and uncorrected measurement data at each measurement frequency. The sparse calibration data may be generated by measuring every Nth frequency step over a calibration frequency range greater than a specified measurement frequency range, or by measuring every frequency step over the calibration frequency range and compressing the resulting measurement data. The interpolation may be achieved by using a curve-fit algorithm, such as a parametric polynomial curve fitting algorithm.
An improved method of calibrating a vector network analyzer of the type that performs measurements over a user specified measurement frequency range less than a total frequency range for the vector network analyzer in discrete frequency steps and corrects the measurements using calibration data generated from reference impedances comprising the steps of:
An improved method of calibrating a vector network analyzer of the type that performs measurements over a user specified measurement frequency range less than a total frequency range for the vector network analyzer in discrete frequency steps and corrects the measurements using calibration data generated from reference impedances comprising the steps of:
Dependencies are inferred from the claim text.