Test device and method for electrically testing electronic device
AssigneeAdvantest Corporation
InventorsYasuo Furukawa, Koji Asami
Life of this patent
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Abstract
A test device for electrically testing an electronic device (DUT) 100 comprises a pattern memory 13A, a pattern generator 13, a first filter 20B, and a pin electronic assembly 19. The pattern memory 13A stores data defining test patterns to be supplied to the DUT 100. The pattern generator 13 generates a plurality of test patterns to be input to a plurality of input pins of the DUT using digital signals based on the data stored in the pattern memory 13A. The first filter converts at least one of the plurality of test patterns to analog signals. The pin electronic assembly 19 supplies the plurality of test patterns including the analog signal test pattern to the DUT 100.
Claims26
A test device for electrically testing an electronic device having first and second input pins, comprising:
- a pattern generator generating first and second test patterns based on digital signals based on data defining a plurality of test patterns including an analog signal test pattern and a digital signal test pattern to be supplied to said electronic device;
- and
- a pin electronic assembly comprising a first pin electronic element connected to the first input pin of the electronic device and a second pin electronic element connected to the second input pin of the electronic device,
- each of said first pin electronic element and said second pin electronic pin element further comprising:
- a first filter converting said digital data for said analog signal test pattern to analog signals
- each of said pin electronic elements selectively outputting one of said analog signal test pattern converted by said first filter and said digital signal test pattern.
A method for electrically testing an electronic device having a first and second input pins, comprising:
- generating first and second test patterns using digital signals, based on data defining said first and second test patterns including an analog signal test pattern and a digital signal test pattern to be supplied to the first and second input pins of said electronic device;
- converting said digital signals of said analog signal test pattern to said analog signals by respectively filtering said digital signals using first and second pin electronic elements connected to said first and second input pins;
- and
- selectively outputting one of said analog signal test pattern and digital signal test pattern to said electronic device through each of said pin electronic elements.
A testing method for electrically testing an electronic device including an analog circuit and a digital circuit comprising:
- a first step of generating a digital data based on a single timing signal, said digital data including first digital data for analog signals for testing said analog circuit and second digital data for digital signals for testing said digital circuit;
- a second step of converting said first digital data for analog signals for testing said analog circuit to analog signals by respectively filtering digital data using pin electronic elements that are connected to said analog and digital circuits;
- and
- a third step of selectively outputting one of said analog signals and said digital signals to said analog and digital circuits through each of said pin electronic elements.
Dependencies are inferred from the claim text.