Apparatus and method for fast memory fault analysis
AssigneeHewlett-Packard Development Company, L.P.
InventorAntonio Martinez
Life of this patent
Estimating the term…
Abstract
A memory fault analyzer having a comparator and fault analyzer storage is disclosed along with a method of testing faults of the memory using a built in fault analyzer. The memory is tested by writing a known data onto a bit, reading the bit for stored data, comparing the known data with the stored data, and storing address of faulty bits in the fault analyzer. Because the fault analyzer is built in with the memory, the process is very fast. And, the fault analyzer may count the number of rows and the number of columns requiring replacement, compare the counted numbers with the number of available redundant rows and columns, and generate a repairability signal.
Claims24
An apparatus comprising:
- memory having addressable storage locations;
- fault analyzer for storing address of a fault location within the memory;
- wherein the fault analyzer determines repairability of the apparatus based on a sum comparison.
A method of testing a device having memory with addressable location, said method comprising:
- comparing expected data with actual data;
- storing, when the expected data is not equal to the actual data, address of memory location within the memory device;
- and
- comparing sums of a plurality of stored memory address location parameters to assess repairability of the device.
Dependencies are inferred from the claim text.