Analysis of a composition
AssigneeKoninklijke Philips Electronics N.V.
InventorsGerhardus Wilhelmus Lucassen, Robert Frans Maria Hendriks, Marjolein Van Der Voort, Gerwin Jan Puppels
Life of this patent
Estimating the term…
Abstract
An analysis apparatus, in particular a spectroscopic analysis apparatus, comprises an excitation system (exs) for emitting an excitation beam (exb) to excite a target region during an excitation period. A monitoring system (lso) is provided for emitting a monitoring beam (irb) to image the target region during a monitoring period. The monitoring period and the excitation period being substantially overlap, so that monitoring the target region is maintained during excitation. The analysis apparatus is provided with a tracking system (osc, dcu) to control the excitation system to direct the excitation beam onto the target region.
Claims15
A spectroscopic analysis apparatus, comprising:
- an excitation system for emitting an excitation beam to excite a target region during an excitation period;
- a monitoring system for emitting a monitoring beam to image the target region during a monitoring period, the monitoring period and the excitation period being substantially overlapping;
- and
- a tracking system arranged to control the excitation system to direct the excitation beam onto the target region if the target region moves.
A method for spectral non-invasive analysis of a composition of an object comprising the steps of:
- imaging a target region, during a monitoring period;
- exciting the target region with an excitation beam during an excitation period;
- and
- if the target region moves, directing the excitation beam onto the target region during an overlap period of the excitation period and the monitoring period.
Dependencies are inferred from the claim text.