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US 6,686,756 B2Granted
Vddq integrated circuit testing system and method
AssigneeEcole de Technologies Superieure
InventorClaude Thibeault
Life of this patent
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Abstract
A system for Vddq integrated circuit (IC) testing is described herein. The systems teaches the positioning of a resistive element between a voltage source and the power supply terminal of the IC under test and the approximation of the voltage value at the power supply terminal when the IC is generally in a steady state. Depending on the approximated voltage value, the IC under test may be determined faulty or not.
Claims8
A system for testing an integrated circuit (IC) having a power supply terminal VDD for defects, said system comprising:
- a voltage source having a voltage source output terminal Vaa;
- a resistive element connected to said voltage source output terminal Vaa;
- said resistive element being connectable to the power supply terminal VDD of the IC;
- at least one controllable output voltage source having an output voltage terminal VVS;
- at least one switch element so configured as to selectively connect said output voltage terminal VVS to the power supply terminal VDD;
- a differentiator connected to the power supply terminal VDD;
- said differentiator being so configured as to determine a direction of a voltage variation at the power supply terminal VDD;
- and
- a controller connected to said at least one controllable output voltage source, to said at least one switch element, to said differentiator and to the IC to thereby supply at least one test vector thereto;
- said controller being so configured as to approximate a voltage value of the power supply terminal VDD and to determine, via the approximated voltage value, if the IC under test is faulty.
7 more elements
Dependencies are inferred from the claim text.