Methods for wireless testing of integrated circuits

A method of using test equipment to test an electrical circuit within an electronic device, the method comprising the steps of:

• placing a probe of the test equipment within 10 cm of the electrical circuit;
• applying a first test signal to the electrical circuit via an electrical signal input to the electrical signal, wherein the first test signal does not provide a power source for said electrical circuit;
• generating, by the electrical circuit in response to the first test signal, a radio frequency carrier wave;
• encoding, by the electrical circuit, information onto the carrier wave to produce a modulated wave;
• wirelessly detecting, without using an external antenna, by the probe, the modulated wave;
• and decoding by the test equipment, the information about the modulated wave.

A method for wireless testing of integrated circuits, comprising the steps of:

• applying an electrical input signal from a testing device to an integrated circuit through an electrical signal input of said integrated circuit that is electrically connected to said testing device, wherein said electrical input signal does not provide a power source for said integrated circuit;
• applying an electromagnetic input signal from said testing device to said integrated circuit by way of a probe electrically connected to said testing device emitting said electromagnetic input signal and said integrated circuit sensing said electromagnetic input signal;
• and
• receiving an electromagnetic output signal from said integrated circuit to said testing device by way of said integrated circuit emitting said electromagnetic output signal in response to at least one of said electrical input signal and said electromagnetic input signal and said probe, without using an external antenna, sensing said electromagnetic output signal.