Method and apparatus for monitoring integrity of wires or electrical cables
AssigneeCM Technologies, Inc.
InventorsGregory Allan, Rollin Van Alstine
Life of this patent
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AssigneeCM Technologies, Inc.
InventorsGregory Allan, Rollin Van Alstine
Estimating the term…
An apparatus for monitoring integrity of a wire is provided, which includes a TDR instrument for generating a pulse waveform for transmission through the wire. The apparatus also includes a function generator for generating a forcing waveform for transmission through the wire. The pulse waveform is transmitted through the wire by itself, and then in combination with the forcing waveform.
An apparatus for monitoring integrity a wire, comprising:
A method for monitoring integrity of a wire, comprising the steps of:
Dependencies are inferred from the claim text.
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Locating faults in cables, transmission lines, or networks: using pulse reflection methods
Testing of electric installations on transport means: on air- or spacecraft, railway rolling stock or sea-going vessels
Measuring electric variables
Term ended 31 Jan 2022 (estimated)
1. Field of the Invention
The present invention pertains to a method and apparatus for monitoring the integrity of wires or electrical cables, or the like, including but not limited to detecting faults or defects in the same.
2. Related Background Art
FIG. 1 shows curves of DF versus frequency for polar and non-polar materials.
FIG. 2 is a block diagram of the system of one embodiment of the present invention.
FIG. 3 shows 2 TDR signatures (curves of voltage versus distance along a wire under test), one collected while the wire is not excited by an AC voltage and one collected while the wire is so excited.
The method and apparatus of the present invention may be used to test wiring, for example, for periodic routine maintenance, post-installation verification, or troubleshooting, in order to prevent or resolve performance problems caused by defects, damage or deterioration due to aging or environmental factors. The present invention may also be used to determine the location, type and magnitude of a defect or fault in an installed wire or in a device connected to a wire.
The terms “fault” and “defect” are both used to refer to that which is a deviation from a virgin wire. But a “defect” is distinguished from a “fault” in that the presence of a defect does not affect the operation of the wire or the circuit containing the wire, whereas the presence of a “fault” adversely affects the operation of the wire or circuit containing the wire. An example of a fault would be an open or short circuit, and an example of a defect could be a wire having nicked or chafed insulation.
While conventional TDR technology is capable of detecting only faults in a wire, the present invention may detect faults or defects. Further, while conventional TDR technology is generally capable of detecting only the first fault along the wire in the direction away from the injection point of the TDR pulse, the present invention may detect multiple defects or faults along the length of a single wire.