Method and apparatus for regulating electron emission in field emitter devices
AssigneeThe United States of America as represented by the Secretary of the Navy
InventorsJonathan L. Shaw, David S. Y. Hsu
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AssigneeThe United States of America as represented by the Secretary of the Navy
InventorsJonathan L. Shaw, David S. Y. Hsu
Estimating the term…
An apparatus and method for regulating the emission current from a single (macroscopic) field emitter, from groups of emitters within a large (microscopic) array, or from each cell within an array is described. The apparatus includes an additional aperture, fabricated at each field emitter array cell, to create and electron energy filter. The filter aperture of the electron energy filter is similar to the gate aperture but located above or in front of the gate aperture, and is held at a positive potential lower than the gate. The filter allows only those electrons with energy greater than some minimum (the cutoff energy) to pass through. A current-limiting circuit is placed in series with the gate aperture, limiting the total current of electrons that do not pass through the filter. Thus, emission from low energy states is limited without limiting emission from states near the Fermi level.
A cathode apparatus capable of regulating current, comprising:
A cathode apparatus, comprising:
A method of regulating current emitted from a cathode, the method comprising:
A method of reducing beam current in a cathode, comprising:
In a cathode device having a gate electrode with a gate aperture therein, an emitter structure, a filter electrode, and a feedback circuit connected to the gate electrode, a method of improving the performance of the field emission cathode comprising:
An apparatus for improving the performance of a cathode, comprising:
A cathode apparatus capable of regulating current, comprising:
Dependencies are inferred from the claim text.
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Electron guns using a field emission, photo emission, or secondary emission electron source: with microengineered cathode, e.g. Spindt-type
For electronic or optoelectronic application: electron emitter, e.g. spindt emitter tip coated with nanoparticles
Electric discharge tubes or discharge lamps
Technical subjects covered by former uspc cross-reference art collections [xracs] and digests
Term ended 13 Jan 2023 (estimated)
1. Field of the Invention
The present invention generally relates to electron emission devices. More particularly, it relates to a method and apparatus for improving the performance of field emitter devices by detecting the emission of electrons at excessively positive potentials and regulating the current produced at the excessively positive potentials.
2. Description of Related Art
A more complete understanding of the present invention may be had by reference to the following Detailed Description when taken in conjunction with the accompanying drawings wherein:
FIG. 1 shows a cross sectional view-of a single cell within a prior art field emitter array (FEA);
FIG. 2 shows an energy distribution graph produced by a typical single macroscopic field emitter made from molybdenum wire;
Referring to FIG. 4, there is shown a cross-sectional view of a single field emission cell from a field emitter array (FEA) having a filter aperture in a preferred embodiment of the invention. A single FEA cell 400 is shown and described in FIG. 4, although the overall FEA may include many of the FEA cells, fabricated in the form of a planar array.
A second aperture 15 (hereinafter “filter aperture 15”) is provided in a conductive layer 18 (alternately referred to as “filter electrode”) separated from the gate layer 8 by a dielectric layer 16. The electric potential in a center region of the filter aperture 15 is controlled by the voltage 24 applied to the conductive layer 18. Electrons with energies greater than the vacuum level inside the filter aperture 15 are permitted to pass through the filter aperture 15.
The trajectories 22 shown on the left side of FIG. 4, are examples of transmitted electrons. Electrons having energies below the vacuum level inside the filter aperture 15 are rejected and are collected by the gate layer 8. The trajectories 20 shown on the right side are examples of reflected electrons. Current collected at the gate aperture 10 causes a voltage to appear across the resistance 26, thereby reducing the electric potential at the gate aperture 10 and so reducing the electric field at the emission site 4.