Integrated multi-chip chip scale package
AssigneeKingston Technology Corporation
InventorsWei H. Koh, Fred Kong, Daniel Hsu
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AssigneeKingston Technology Corporation
InventorsWei H. Koh, Fred Kong, Daniel Hsu
Estimating the term…
A vertically integrated chip scale package (CSP) assembly comprising two or more single chip package subassemblies having an upper level CSP subassembly superimposed directly above a lower level CSP subassembly. The lower-most CSP subassembly in the vertical stack contains an array of solder balls for interconnection to a printed wiring board. The vertical electrical connection between the upper and lower level package subassemblies is accomplished by using wire bonding from perimeter wire bonding pads located on an upper level substrate extension to matching perimeter wire bonding pads located on a lower level substrate extension that is longer in length than the upper level substrate extension. The stacked package subassemblies are bonded together by using a thin adhesive material, and the perimeter wire bonds are encapsulated by an encapsulant for protection. The assembled vertical stack has the appearance of a single CSP but is shorter in height than two individual packages that are stacked together with solder ball interconnects located therebetween.
An integrated chip scale package assembly comprising at least first and second chip scale packages disposed one above the other, wherein the first of said first and second chip scale packages includes an integrated circuit chip,
An integrated scale package assembly comprising a plurality of chip scale package subassemblies that are arranged in a vertical stack one above the other, each of said plurality of chip scale package subassemblies having an integrated circuit chip mounted on a substrate such that the substrate of an upper one of said chip scale package subassemblies in the vertical stack is mounted directly on top of the integrated circuit chip of an adjacent lower one of said chip scale package subassemblies, each substrate having a plurality of perimeter wire bonding pads and a plurality of electrically conductive signal traces connected between said plurality of perimeter wire bonding pads and the integrated circuit chip mounted on said substrate,
Dependencies are inferred from the claim text.