Individual selective rework of defective BGA solder balls
AssigneeMicron Technolgy, Inc.
InventorsKwan Yew Kee, Chew Boon Ngee, Keith Wong Bing Chiang
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AssigneeMicron Technolgy, Inc.
InventorsKwan Yew Kee, Chew Boon Ngee, Keith Wong Bing Chiang
Estimating the term…
A method for reworking a ball grid array (BGA) of solder balls including one or more defective solder balls on an electronic component workpiece using a single-ball extractor/placer apparatus having a heatable capillary tube pickup head optionally augmented with vacuum suction. A defective solder ball is identified, extracted by the pickup head and disposed of. A nondefective solder ball is picked up by the pickup head, positioned on the vacated attachment site, and thermally softened for attachment to the workpiece. Flux may be first applied to the replacement solder ball or to the vacated attachment site. The extractor/placer apparatus may be automated to locate, extract and replace defective balls for completion of a fully operable BGA.
A method for correcting a defective ball grid array on an electronic component workpiece, the method comprising:
A method for removing and replacing a solder ball from an attachment site of a ball grid array on an electronic component workpiece, the method comprising:
A method for extracting and removing at least one defective solder ball from an attachment site in a ball grid array of an electronic component workpiece, comprising:
An apparatus for extracting and replacing an individual solder ball mounted on an attachment site on an electronic component workpiece, the apparatus comprising:
Dependencies are inferred from the claim text.